SNJ54BCT8374AFK
Texas Instruments
型号:
SNJ54BCT8374AFK
封装:
28-LCCC (11.43x11.43)
批次:
-
数据手册:
描述:
SCAN TEST DEVICES WITH OCTAL D-T
购买数量:
库存 : 请查询
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产品信息
参数信息
用户指南
| Mfr | Texas Instruments |
| Series | 54BCT |
| Package | Tube |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Package / Case | 28-CLCC |
| Product Status | Active |
| Supply Voltage | 4.5V ~ 5.5V |
| Operating Temperature | -55°C ~ 125°C |
| Supplier Device Package | 28-LCCC (11.43x11.43) |
2000+日均询价数量
30,000,000标准产品数量
2800+全球品牌
15,000 ㎡库存仓库
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