SN74BCT8374ADW
Texas Instruments
型号:
SN74BCT8374ADW
封装:
24-SOIC
批次:
-
数据手册:
-
描述:
IC SCAN TEST DEVICE W/FF 24-SOIC
购买数量:
库存 : 75
最小起订量: 1 最小递增量: 1
数量
单价
1
11.1245
10
10.0453
25
9.57828
100
8.316585
250
7.942836
500
7.241983
1000
6.307544
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产品信息
参数信息
用户指南
| Mfr | Texas Instruments |
| Series | 74BCT |
| Package | Tube |
| Logic Type | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| Mounting Type | Surface Mount |
| Number of Bits | 8 |
| Package / Case | 24-SOIC (0.295", 7.50mm Width) |
| Product Status | Active |
| Supply Voltage | 4.5V ~ 5.5V |
| Base Product Number | 74BCT8374 |
| Operating Temperature | 0°C ~ 70°C |
| Supplier Device Package | 24-SOIC |
2000+日均询价数量
30,000,000标准产品数量
2800+全球品牌
15,000 ㎡库存仓库
快速链接
